Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties

0351882 - ÚJF 2011 CA eng A - Abstrakt
Macková, Anna - Malinský, Petr - Hnatowicz, Vladimír - Khaibullin, R. I. - Slepička, P. - Švorčík, V. - Šlouf, Miroslav - Peřina, Vratislav
Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties.
17th International conference on ion beam modification of materials, book of abstracts. Vol. P2-4-146. 2010. Roč. 2010 (2010), s. 127-127.
[17th international conference on ion beam modification of materials. 22.08.2010-27.08.2010, Montreal]
Grant CEP: GA AV ČR(CZ) KAN400480701; GA ČR GA106/09/0125
Výzkumný záměr: CEZ:AV0Z10480505; CEZ:AV0Z40500505
Klíčová slova: Ni ion implantation * polymers * depth profiles * RBS * TEM * AFM
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at RT to the fluences (0.25-1.5)x1017 cm-2 at ion current density of 4 μA.cm-2. Then some of the samples were annealed at the temperatures close tothe glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree well with those calculated using TRIDYN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM.
Trvalý link: http://hdl.handle.net/11104/0191527