Microscopy of nanoparticles and films with nanoparticles

0346198 - ÚFE 2011 CZ eng C - Konferenční příspěvek (zahraniční konf.)
Kacerovský, Pavel - Žďánský, Karel - Procházková, Olga - Vaniš, Jan - Grym, Jan - Vasiliev, A. - Pašajev, E. M.
Microscopy of nanoparticles and films with nanoparticles.
Materials Structure in Chemistry, Biology, Physics and Technology. Praha: CSCA, 2009 - (Černý, R.; Fiala, J.; Hašek, J.), s. 38-39. ISSN 1211-5894.
[Stucture 2009, Colloquium Czech and Slovak Crystallographic Assosiation. Hluboká nad Vltavou (CZ), 22.06.2009-25.06.2009]
Grant CEP: GA ČR GA102/09/1037; GA AV ČR(CZ) KAN401220801
Výzkumný záměr: CEZ:AV0Z20670512
Klíčová slova: semiconductor devices * nanostructures
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

To study the electrophoreticaly deposited nanolayers of reverse micelles with Pd nano-particles on n-type InP substrates a wide range of current microscopic methods has been used. What concerns analytical methods the X-ray diffraction and mass spectrometry SIMS were used. The most relevant results about Pd nanoparticles in the layer were obtained by using HRTEM microscopy and SIMS spectrometry. In nanolayers crystallographic arrangement of Pd nanoparticles has not been found.
Trvalý link: http://hdl.handle.net/11104/0187284