The Morphology of Ni+ implanted structures in PEEK, PET and PI

0332858 - ÚJF 2010 GB eng A - Abstrakt
Macková, Anna - Malinský, Petr - Khaibullin, R. I. - Slepička, P. - Švorčík, V. - Šlouf, Miroslav
The Morphology of Ni+ implanted structures in PEEK, PET and PI.
Abstract book, 19th International conference on Ion beam analysis. Cambridge: IOP, Institute of physics, 2009.
[19th International conference on Ion beam analysis. 07.09.2009-11.09.2009, Cambridge]
Grant CEP: GA MŠMT(CZ) LC06041
Výzkumný záměr: CEZ:AV0Z10480505; CEZ:AV0Z40500505
Klíčová slova: Ni ion implantation * polymers * depth profiles * RBS * TEM * AFM
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature using different fluences. The samples were then annealed at different temperatures close to the glassy transition temperature. The depth profiles of the Ni atoms were determined by the RBS method. The surface morphology of the implanted polymers was studied using AFM. The size and distribution of the Ni nanoparticles created in the polymer surface layer were determined using TEM. In the case of PET, the annealing results in a significant redistribution of the Ni atom-particles towards the sample depth. According to the TEM observation on the PI as well as the as-implanted PET and PEEK samples, the diameter of the Ni nanoparticles increases with increasing ion fluence. Subsequent annealing leads to a slight reduction in the nanoparticle diameter depending on the polymer type. With increasing annealing temperature, the surface morphology changes.
Trvalý link: http://hdl.handle.net/11104/0177986