Electron diffraction, elemental and image analysis of nanocrystals

0328343 - ÚMCH 2010 CZ eng J - Článek v odborném periodiku
Šlouf, Miroslav - Pavlova, Ewa - Hromádková, Jiřina - Králová, Daniela - Tyrpekl, Václav
Electron diffraction, elemental and image analysis of nanocrystals.
[Elektronová difrakce, mikroprvková a obrazová analýza nanokrystalů.]
Materials Structure in Chemistry, Biology, Physics and Technology. Roč. 16, 2a (2009), s. 33-34. ISSN 1211-5894.
[Struktura - Colloquium of Czech and Slovak Crystallographic Association. Hluboká nad Vltavou, 22.06.2009-25.06.2009]
Grant CEP: GA AV ČR KAN200520704; GA ČR GA203/07/0717
Výzkumný záměr: CEZ:AV0Z40500505
Klíčová slova: TEM * electron diffraction * nanocrystals
Kód oboru RIV: CD - Makromolekulární chemie

This contribution briefly describes principle and application of analytical transmission electron microscope, i.e. a TEM microscope, which works in bright field (BF), dark field (DF), electron diffraction (ED, SAED) and X-ray microanalysis (EDX, EDS) modes. Such a microscope can be used, among other things, for analysis of nanocrystals, which are too small and/or available in too small amounts for X-ray diffractometers.

This contribution briefly describes principle and application of analytical transmission electron microscope, i.e. a TEM microscope, which works in bright field (BF), dark field (DF), electron diffraction (ED, SAED) and X-ray microanalysis (EDX, EDS) modes. Such a microscope can be used, among other things, for analysis of nanocrystals, which are too small and/or available in too small amounts for X-ray diffractometers.
Trvalý link: http://hdl.handle.net/11104/0174676