Characterization of polystyrene and doped polymethylmethacrylate thin layers

0307936 - ÚJF 2008 RIV NL eng J - Článek v odborném periodiku
Podgrabinski, T. - Hrabovská, E. - Švorčík, V. - Hnatowicz, Vladimír
Characterization of polystyrene and doped polymethylmethacrylate thin layers.
[Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu.]
Journal of Materials Science-Materials in Electronics. Roč. 16, 11-12 (2005), s. 761-765. ISSN 0957-4522. E-ISSN 1573-482X
Grant CEP: GA ČR GA106/03/0514
Výzkumný záměr: CEZ:AV0Z10480505
Klíčová slova: dielectrical properties
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 0.781, rok: 2005

About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity epsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature.

Jsou studovány dielektivické a optické vlastnosti tenkých vrstev PS a PMMA připravovaných z roztoku spinových povlaků.
Trvalý link: http://hdl.handle.net/11104/0160560