Počet záznamů: 1
Deposition and Measurements of Antireflection Coatings for Semiconductor Lasers
- 1.0205376 - UPT-D 20010015 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Lazar, Josef - Pokorný, Pavel
Deposition and Measurements of Antireflection Coatings for Semiconductor Lasers.
Proceedings of the 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 4356). Washington: SPIEThe International Society for Optical Engineering, 2001 - (Peřina, J.; Hrabovský, M.; Křepelka, J.), s. 297-302. ISBN 0-8194-4047-7. ISSN 0277-786X.
[SPIE: Wave and Quantum Aspects of Contemporary Optics. Velké Losiny (CZ), 12.09.2000-15.09.2000]
Grant CEP: GA ČR GA101/98/P270; GA AV ČR IAA2065803
Výzkumný záměr: CEZ:AV0Z2065902
Klíčová slova: electron-beam vacuum evaporation technique * laser diodes * coated diode emission spectra
Kód oboru RIV: BH - Optika, masery a lasery
We present experimental results obtained by deposition of single layer and double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 635-633 nm laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10 -4 and the repeatibility of the deposition process in a range not exceeding 2x10 -4 .
Trvalý link: http://hdl.handle.net/11104/0100990
Počet záznamů: 1