Frequency Noise Analysis of Semiconductor Lasers

0205363 - UPT-D 20010002 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Jedlička, Petr - Lazar, Josef
Frequency Noise Analysis of Semiconductor Lasers.
Proceedings of the 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 4356). Washington: SPIEThe International Society for Optical Engineering, 2001 - (Peřina, J.; Hrabovský, M.; Křepelka, J.), s. 277-282. ISBN 0-8194-4047-7. ISSN 0277-786X.
[SPIE: Wave and Quantum Aspects of Contemporary Optics. Velké Losiny (CZ), 12.09.2000-15.09.2000]
Grant CEP: GA ČR GA101/98/P270; GA AV ČR IAA2065803
Výzkumný záměr: CEZ:AV0Z2065902
Klíčová slova: external-cavity semiconductor laser * fluctuations * frequency noise measurements
Kód oboru RIV: BH - Optika, masery a lasery

For a fundamental etalon of optical frequency based on the external-cavity semiconductor laser (ECL), not only the long-term frequency stability but also the linewidth seems to be an important parameter. The linewidth broadening is dominated by fluctuations (noise) of the optical frequency. Parameters of these fluctuations and their spectral characteristics are crucial information for their suppression. We present an experimental setup for the frequency noise measurements designed for a free running 633 nm ECL with a stabilized reference He-Ne laser. We observed the corner frequency of the 1/f noise of the ECL of approx. 10 MHz. No significant spectral components over the 1/f noise corner frequency were found.
Trvalý link: http://hdl.handle.net/11104/0100977