Počet záznamů: 1
Efect Recognition in Semiconductor Heterostructures on Bevelled Surface
- 1.0204951 - UPT-D 970085 DE eng A - Abstrakt
Srnánek, R. - Škriniarová, J. - Kováč, J. - Frank, Luděk - Novotný, I. - Hotový, I. - Gottschalch, V.
Efect Recognition in Semiconductor Heterostructures on Bevelled Surface.
Abstracts of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors DRIP VII. Berlin: Institute of Crystal Growth, 1997. s. 10.8.
[DRIP /7./. 07.09.1997-10.09.1997, Templin]
Trvalý link: http://hdl.handle.net/11104/0100571
Počet záznamů: 1