0192659 - UOCHB-X 970001 RIV NL eng J - Článek v odborném periodiku
Tykva, Richard - Kopešťanský, Josef
The Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 380, - (1996), s. 198-200. ISSN 0168-9002. E-ISSN 1872-9576
Grant CEP: GA ČR GA206/93/0333; GA ČR GA206/93/1098
Impakt faktor: 1.038, rok: 1996
Trvalý link: http://hdl.handle.net/11104/0088384