The first experience with the specimen preparation for low-voltage transmission electron microscope

0157595 - PAU-O 20023070 CZ eng C - Konferenční příspěvek (zahraniční konf.)
Nebesářová, Jana - Vancová, Marie
The first experience with the specimen preparation for low-voltage transmission electron microscope.
Microscopy 2002. Proceedings of the 2nd (re-established) Annual Meeting of the Czechoslovak Microscopy Society, held on February 8 to 9, 2002 in Hotel Club, Vranovská ves near Znojmo. Brno: Graphical Brno, 2002 - (Frank, L.), s. 35-36. ISBN 80-238-8749-1.
[Annual Meeting of the Czechoslovak Microscopy Society /2./. Vranovská ves (CZ), 08.02.2002-09.02.2002]
Výzkumný záměr: CEZ:AV0Z6022909
Klíčová slova: specimen preparation * low-voltage transmission electron microscopy
Kód oboru RIV: EA - Morfologické obory a cytologie

The low-voltage transmission electron microscope, working in the TEM mode, requires ultrathin sections with a thickness 20-30nm. This demand brings problems with a section cohesion caused by insufficient resin infiltration and with a chatter caused by unequal thickness of the section. The contrast of unstained biological specimens in LV TEM is comparable with the contrast obtained in HV TEM of stained specimens.
Trvalý link: http://hdl.handle.net/11104/0055033