Number of the records: 1  

Collection of secondary electrons in scanning electron microscopes

  1. 1.
    SYSNO0333617
    TitleCollection of secondary electrons in scanning electron microscopes
    Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Source Title Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. - : Wiley
    Document TypeČlánek v odborném periodiku
    Grant OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    Languageeng
    CountryGB
    Keywords detection of electrons * magnetic lenses * secondary electrons * SEM
    Permanent Linkhttp://hdl.handle.net/11104/0178559
     
Number of the records: 1  

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