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Collection of secondary electrons in scanning electron microscopes
- 1.Müllerová, I., Konvalina, I. Collection of secondary electrons in scanning electron microscopes. Journal of Microscopy. 2009, 236(3), 203-210. ISSN 0022-2720. E-ISSN 1365-2818. Available: doi: 10.1111/j.1365-2818.2009.03189.x
Number of the records: 1