Number of the records: 1
Optical and Quantum Sensing and Precision Metrology II
- 1.0569549 US BXXS
Scheuer, J. (ed.) - Shahriar, S. M. (ed.)
Optical and Quantum Sensing and Precision Metrology II.
Bellingham: SPIE, 2022. Proceedings of SPIE, 12016. ISBN 978-1-5106-4903-3. ISSN 0277-786X
Number of the records: 1