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AFM measurements of novel solar cells. Studying electronic properties of Si-based radial junctions
- 1.0432247 - FZÚ 2015 RIV DE eng J - Journal Article
Hývl, Matěj
AFM measurements of novel solar cells. Studying electronic properties of Si-based radial junctions.
G.I.T. Imaging and Microscopy. -, č. 1 (2014), s. 52-53. ISSN 1439-4243
R&D Projects: GA ČR GA13-25747S; GA ČR GA13-12386S; GA MŠMT(CZ) LM2011026
Institutional support: RVO:68378271
Keywords : AFM measurements * conductive cantilever * electronic properties * nanowires * PF TUNA
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.imaging-git.com/science/scanning-probe-microscopy/afm-measurements-novel-solar-cells
In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction solar cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.
Permanent Link: http://hdl.handle.net/11104/0236681
Number of the records: 1