Progress in x-ray optics development with formed glass and Si wafers

0357492 - ASÚ 2011 RIV US eng C - Conference Paper (international conference)
Hudec, René - Pína, L. - Semencová, V. - Skulinová, Michaela - Inneman, A. - Švéda, L. - Míka, M. - Kačerovský, R. - Prokop, J. - Černý, M.
Progress in x-ray optics development with formed glass and Si wafers.
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III. Bellingham: SPIE, 2007 - (O'Dell, S.; Pareschi, G.), s. 1-12. Proceedings of the SPIE, 6688. ISBN 9780819468369. ISSN 0277-786X.
[Optics for EUV, X-Ray, and Gamma-Ray Astronomy /3./. San Diego (US), 29.08.2007-29.08.2007]
R&D Projects: GA ČR GP202/07/P510
Keywords : X-ray optics * X-ray telescopes
Subject RIV: BN - Astronomy, Celestial Mechanics, Astrophysics

The precisely shaped glass sheets and Si wafers are generally considered as the most promising substrates for future large space astronomical X-ray telescopes. Both approaches have demonstrated promising results obtained in the course of last years. In this contribution, we report on continued systematic efforts and analysis in precise shaping of thin glass sheets as well as Si wafers. New results will be briefly presented and discussed. For Si wafers, recent efforts focus also on improving the intrinsic quality of the slices to better meet the high requirements of future space projects.
Permanent Link: http://hdl.handle.net/11104/0195757