Počet záznamů: 1

Scanning Very Low Energy Electron Microscopy

  1. 1.
    0368827 - UPT-D 2012 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
    Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
    Scanning Very Low Energy Electron Microscopy.
    NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
    [NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
    Grant CEP: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    Recent developments in applications of the scanning very low energy electron microscopy in selected branches of materials science are reviewed. The examples include visualization of grains in conductive polycrystals including ultrafine grained metals, identification of the local crystal orientation upon reflectance of very slow electrons, transmission mode with ultrathin free-standing films including graphene, acquisition of a quantitative dopant contrast in semiconductors, and examination of thin surface coverages.
    Trvalý link: http://hdl.handle.net/11104/0203060