Počet záznamů: 1

Thin dielectric resonators for microwave characterization of films and substrates

  1. 1.
    0368068 - FZU-D 2012 RIV UA eng C - Konferenční příspěvek (zahraniční konf.)
    Bovtun, Viktor - Pashkov, V. - Kempa, Martin - Molchanov, V. - Kamba, Stanislav - Poplavko, Y. - Yakymenko, Y.
    Thin dielectric resonators for microwave characterization of films and substrates.
    Microwave and Telecommunication Technology (CriMiCo) 2011. 21th International Crimean Conference. Sevastopol: Veber, 2011 - (Ermolov, P.), 620-621. ISBN 978-966-335-351-7.
    [International Crimean Conference "Microwave and Telecommunication Technology" /21./ (CriMiCo´2011). Sevastopol (UA), 12.09.2011-16.09.2011]
    Výzkumný záměr: CEZ:AV0Z10100520
    Klíčová slova: microwave dielectric properties * thin film * dielectric resonator
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

    Thin dielectric resonator consisting only of the low-loss dielectric substrate and deposited film is proposed for the electrode-free microwave characterization of thin films and substrates. In-plane microwave dielectric parameters of a number of substrates and thin films were measured in a broad temperature range using the TE01δ resonance mode. Dielectric anomalies corresponding to the induced phase transitions were observed. The HE11δ mode is proposed for the in-plane dielectric anisotropy characterization. The anisotropy of the (110) DyScO3 substrate was measured.
    Trvalý link: http://hdl.handle.net/11104/0202530