Počet záznamů: 1

Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass

  1. 1.
    0368047 - URE-Y 2012 RIV US eng J - Článek v odborném periodiku
    Stepanov, B. - Ren, J. - Wágner, T. - Lorinčík, Jan - Frumar, M. - Churbanov, M. - Chigirinsky, Y.
    Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass.
    Journal of the American Ceramic Society. Roč. 94, č. 7 (2011), 1986-1988 ISSN 0002-7820
    Výzkumný záměr: CEZ:AV0Z20670512
    Klíčová slova: Solid state diffusion * Secondary Ion Mass Spectrometry * Tellurite glass
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Impakt faktor: 2.272, rok: 2011

    Copper doped multi-component tellurite glasses were prepared by solid state electric field assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc-like solution of the second Fick’s law, which assumes that both Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabrication of copper doped planar waveguides based on the tellurite glasses.
    Trvalý link: http://hdl.handle.net/11104/0202518