Počet záznamů: 1

Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

  1. 1.
    0366182 - FZU-D 2015 RIV DE eng J - Článek v odborném periodiku
    Holovský, Jakub - Dagkaldiran, U. - Remeš, Zdeněk - Purkrt, Adam - Ižák, Tibor - Poruba, Aleš - Vaněček, Milan
    Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates.
    Physica Status Solidi. A. Roč. 207, č. 9 (2010), s. 578-581 ISSN 1862-6300
    Grant CEP: GA ČR GD202/09/H041; GA ČR GA202/09/0417
    GRANT EU: European Commission(XE) 38885 - SE-POWERFOIL
    Výzkumný záměr: CEZ:AV0Z10100521
    Klíčová slova: solar cell * silicon * spectroscopy
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 1.458, rok: 2010

    Fourier transform photocurrent spectroscopy(FTPS)is used as an inspection method for hydrogenated amorphous silicon(a-Si:H)thin films deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process.
    Trvalý link: http://hdl.handle.net/11104/0201253