In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires

0365167 - FZÚ 2012 RIV CH eng J - Článek v odborném periodiku
Malard, B. - Pilch, Jan - Šittner, Petr - Delville, R. - Curfs, C.
In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires.
Solid State Phenomena. 172-174, č. 6 (2011), s. 1243-1248. ISSN 1012-0394
Grant CEP: GA AV ČR(CZ) IAA200100627; GA MŠMT(CZ) LA10010
Výzkumný záměr: CEZ:AV0Z10100520
Klíčová slova: recovery process * electropulse treatment * in-situ analysis * superelasticity
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Recovery processes responsible for evolution of microstructures in 0.1mm thin cold-drawn Ni-Ti shape memory alloy wire heat treated by DC electric pulse were investigated by combination of in-situ tensile stress - strain, electrical resistance and X-ray diffraction measurements. The X-ray data were used to obtain direct experimental information on the evolution of the phase fractions, internal strain and defects in the microstructure evolving through activation of a sequence of recovery processes during the short time electropulse treatment. It is shown that superelastic functional properties of the treated Ni-Ti wire can be precisely set by controlling the progress of the recovery processes by prescribing the time evolution of temperature T(t) and tensile stress s(t) (displacement control) in the treated wire.
Trvalý link: http://hdl.handle.net/11104/0200473