Detection of Elliptical Particles in Atomic Force Microscopy Images

0360082 - ÚTIA 2012 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Sedlář, Jiří - Zitová, Barbara - Kopeček, Jaromír - Todorciuc, T. - Kratochvílová, Irena
Detection of Elliptical Particles in Atomic Force Microscopy Images.
ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha: IEEE, 2011, s. 1233-1236. ISBN 978-1-4577-0539-7.
[ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha (CZ), 22.05.2011-27.05.2011]
Grant CEP: GA MŠMT 1M0572; GA ČR GA203/08/1594; GA AV ČR KAN401770651; GA ČR GAP103/11/1552
Výzkumný záměr: CEZ:AV0Z10750506; CEZ:AV0Z10100520
Klíčová slova: particles detection * atomic force microscopy (AFM) imaging * watershed segmentation * image moments * approximation by ellipses
Kód oboru RIV: IN - Informatika
http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy images.pdf

In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; the measured heights are represented by pixel values. Each sample in our project consisted of elliptical particles of principally the same size; the size could be characterized by the average length and width of a number of salient particles. The method we proposed is based on segmentation of undamaged particles and their approximation by ellipses; the major and minor axes provide robust estimates of the lengths and widths of the particles, respectively. The method is robust to distortions typical of AFM images. Its performance was demonstrated on images of pyrroles and compared with manual detection. Results show that the automatic method could be used in place of the time-consuming manual detection.
Trvalý link: http://hdl.handle.net/11104/0197718