Počet záznamů: 1

Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization

  1. 1.
    0353670 - FZU-D 2011 RIV JP eng J - Článek v odborném periodiku
    Yanagida, T. - Fujimoto, Y. - Yoshikawa, A. - Yokota, Y. - Kamada, K. - Pejchal, Jan - Chani, V. - Kawaguchi, N. - Fukuda, K. - Uchiyama, K. - Mori, K. - Kitano, K. - Nikl, Martin
    Development and performance test of picosecond pulse X-ray excited streak camera system for scintillator characterization.
    Applied Physics Express. Roč. 3, č. 5 (2010), 056202/1-056202/3 ISSN 1882-0778
    Výzkumný záměr: CEZ:AV0Z10100521
    Klíčová slova: scintillation decay * streak camera * picosecond X-ray pulse * BaF2
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 2.747, rok: 2010

    To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from VUV to near infrared region (110-900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator.
    Trvalý link: http://hdl.handle.net/11104/0192847