Počet záznamů: 1

Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science

  1. 1.
    0352510 - UPT-D 2011 RIV JP eng C - Konferenční příspěvek (zahraniční konf.)
    Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Mizutani, M. - Narukawa, Y. - Müllerová, Ilona - Frank, Luděk
    Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science.
    Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 77-78. ISBN 978-4-9903248-2-7.
    [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: scanning low energy electron microscopy * AZ 91 * AZ 96 * UFG Al * matal matrix composite materials
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    Progress in materials research is inseparably connected to the development of new analytical methods, which make it possible to examine. The aging hardness the structures of materials at high spatial resolution and sensitivity. A very promising technique for study the microstructure of advanced materials is the scanning low energy electron microscopy (SLEEM).
    Trvalý link: http://hdl.handle.net/11104/0192002