Počet záznamů: 1

Self Heating of an Atomic Force Microscope

  1. 1.
    0350712 - URE-Y 2011 RIV CZ eng J - Článek v odborném periodiku
    Kučera, Ondřej
    Self Heating of an Atomic Force Microscope.
    Acta polytechnica. Roč. 20, č. 1 (2010), s. 9-11 ISSN 1210-2709
    Výzkumný záměr: CEZ:AV0Z20670512
    Klíčová slova: atomic force microscopy
    Kód oboru RIV: JB - Senzory, čidla, měření a regulace

    Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted inluences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is selfheating of the apparatus. This paper deals with self{heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The inluence on the intrinsic contact noise of AFM's is also examined.
    Trvalý link: http://hdl.handle.net/11104/0190642