Počet záznamů: 1

Ray tracing, aberration coefficients and intensity distribution

  1. 1.
    0350668 - UPT-D 2011 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
    Oral, Martin
    Ray tracing, aberration coefficients and intensity distribution.
    Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 49-52. ISBN 978-80-254-6842-5.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
    Grant CEP: GA AV ČR IAA100650805
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: ray tracing * aberration coefficients * intensity distribution
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    In particle optics paraxial ray tracing (solution of the paraxial trajectory equation) provides the basic imaging properties of an optical system and real ray tracing (solution of the equation of motion with time as the parameter) gives the complete particle paths including all aberrations. While there are methods of computing the aberration coefficients directly, for example by evaluating the aberration integrals, ray tracing can also be used for this purpose.
    Trvalý link: http://hdl.handle.net/11104/0190608