Počet záznamů: 1

Electrical Analogy to an Atomic Force Microscope

  1. 1.
    0350413 - URE-Y 2011 RIV CZ eng J - Článek v odborném periodiku
    Kučera, Ondřej
    Electrical Analogy to an Atomic Force Microscope.
    Radioengineering. Roč. 19, č. 1 (2010), s. 168-171 ISSN 1210-2512
    Výzkumný záměr: CEZ:AV0Z20670512
    Klíčová slova: atomic force microscopy
    Kód oboru RIV: JB - Senzory, čidla, měření a regulace
    Impakt faktor: 0.503, rok: 2010

    Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.
    Trvalý link: http://hdl.handle.net/11104/0190426