Počet záznamů: 1

On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument

  1. 1.
    0349994 - URE-Y 2011 RIV NL eng J - Článek v odborném periodiku
    Williams, P. - Franzreb, K. - Sobers Jr., R. C. - Lorinčík, Jan
    On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument.
    Nuclear Instruments & Methods in Physics Research Section B. Roč. 268, 17-18 (2010), s. 2758-2765 ISSN 0168-583X
    Výzkumný záměr: CEZ:AV0Z20670512
    Klíčová slova: SIMS * noble gases * uranium
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Impakt faktor: 1.042, rok: 2010

    We have investigated the report by Desgranges and Pasquet (2004) [1] that O2 gas flooding in a secondary ion mass spectrometer could enhance by a factor of about ~5 the Xe+ ion yield for a Xe implant in UO2 sputtered by O2+ primary ions. For a Xe implant in Si sputtered by O2+ primary ions and for Xe+ sputtering of silicon in steady state, O2 gas flooding reduced the Xe+ ion signal by a factor of about 2, presumably due to loss of Xe+ by resonant charge exchange with gas-phase oxygen molecules. The yield of a Kr co-implant in Si was unaffected by oxygen flooding. However, we demonstrate that for steady-state Ar+ sputtering of uranium, the Ar+ ion yield can be increased by a factor of ~1.7 by oxygen flooding.
    Trvalý link: http://hdl.handle.net/11104/0190104