Optimization of a bent perfect Si(111) monochromator at a small take-off angle for use in a stress instrument

0346634 - ÚJF 2011 RIV GB eng J - Článek v odborném periodiku
Seong, B. S. - Em, V. - Mikula, Pavol - Šaroun, Jan - Kang, M.H.
Optimization of a bent perfect Si(111) monochromator at a small take-off angle for use in a stress instrument.
Journal of Applied Crystallography. Roč. 43, č. 3 (2010), s. 654-658. ISSN 0021-8898. E-ISSN 1600-5767
Grant CEP: GA ČR GAP204/10/0654
Výzkumný záměr: CEZ:AV0Z10480505
Klíčová slova: SENSITIVE NEUTRON DETECTOR * MOSAIC CRYSTALS * DIFFRACTION
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 3.794, rok: 2010

The reflectivity and resolution properties of focusing cylindrically bent perfect crystal Si(111) monochromators of different diffraction geometries were tested with the aim of evaluating their possible use in a stress instrument with an unusually small take-off angle (2 theta(M) similar or equal to 30 degrees). The experiments showed that an Si crystal with reflecting planes (111) in the symmetric diffraction geometry provides a maximum figure of merit for accuracy in the peak position that is comparable to that achieved previously from an optimized Si(220) monochromator at 2 theta(M) similar or equal to 55 degrees.
Trvalý link: http://hdl.handle.net/11104/0005992