Interpretation of Profile and Intercept Counts in Microstructure Characterization

0343472 - MÚ 2011 RIV CH eng C - Konferenční příspěvek (zahraniční konf.)
Saxl, Ivan - Sklenička, Václav
Interpretation of Profile and Intercept Counts in Microstructure Characterization.
Recent Developments in the Processing and applications of Structural Metals and Alloys. Zurich: Trans Tech Publications LTD, 2009 - (Cabibbo, M.; Spigarelli, S.), s. 403-410. Materials Science Forum, Vol. 604-605. ISSN 0255-5476.
[Recent Developments in the Processing and Applications of Structural Metals and Alloys. Como (IT), 22.06.2008-25.06.2008]
Grant CEP: GA AV ČR IAA2041301; GA ČR GA201/06/0302
Výzkumný záměr: CEZ:AV0Z10190503; CEZ:AV0Z20410507
Klíčová slova: microstructure characterization * intercept count * grain density * metallography
Kód oboru RIV: BA - Obecná matematika

The results of intercept and profile counts are commonly interpreted as a suitable estimates of the mean grain size as represented e.g. by the grain density N-V, The term grain size is not explicitly defined even when some relation to grain volume and/or mean grain breadth (the mean Ferret diameter) is tacitly assumed. However, the intercept count N-L is directly related to the mean value of grain boundary area per unit volume S-V and the profile count N-A is, under relatively general assumptions, directly related to the mean value of grain junctions per unit volume L-V. Their relation to N-V can be generally written as N-V = c'(N-A)(3/2) = c ''(N-L)(3), but the coefficients c' and c '' strongly depend on the structural characteristics like grain size dispersion, anisotropy etc. and their evaluation is far from being simple. Consequently, whereas the reliable estimates of S-V and L-V result from intercept and profile counts, the estimate of grain density based on them requires a careful consideration.
Trvalý link: http://hdl.handle.net/11104/0185945