Počet záznamů: 1

Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy

  1. 1.
    0342304 - UT-L 2011 RIV BE eng J - Článek v odborném periodiku
    Landa, Michal - Růžek, Michal - Sedlák, Petr - Seiner, Hanuš - Bodnárová, Lucie - Zídek, Jan
    Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy.
    Journal of Physics: Conference Series. Roč. 214, č. 1 (2010), s. 1-5 ISSN 1742-6588.
    [International Conference on Photoacoustic and Photothermal Phenomena /15./. Leuven, 19.07.2009-23.07.2009]
    Grant CEP: GA ČR(CZ) GA101/09/0702
    Výzkumný záměr: CEZ:AV0Z20760514
    Klíčová slova: resonant ultrasound spectroscopy (RUS) * thin films * DLC
    Kód oboru RIV: BI - Akustika a kmity
    http://iopscience.iop.org/1742-6596/214/1/012045/

    The laser-based modal resonant ultrasound spectroscopy is modified for measurements of thin surface layers on a substrate. This paper describes determination of all in-plane elastic properties of thin layers from small resonant frequency shifts of substrate induced by deposition of the layer.
    Trvalý link: http://hdl.handle.net/11104/0185069