Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

0340747 - ÚPT 2010 RIV JP eng J - Článek v odborném periodiku
Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270. ISSN 1345-9678. E-ISSN 1347-5320
Grant CEP: GA AV ČR IAA100650902
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: low energy scanning electron microscopy * thin foils * transmission of very slow electrons
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 0.779, rok: 2010
http://www.jim.or.jp/journal/e/51/02/265.html

Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.
Trvalý link: http://hdl.handle.net/11104/0183928