Počet záznamů: 1

Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

  1. 1.
    0340747 - UPT-D 2010 RIV JP eng J - Článek v odborném periodiku
    Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
    Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
    Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270 ISSN 1345-9678
    Grant CEP: GA AV ČR IAA100650902
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: low energy scanning electron microscopy * thin foils * transmission of very slow electrons
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
    Impakt faktor: 0.779, rok: 2010
    http://www.jim.or.jp/journal/e/51/02/265.html

    Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.
    Trvalý link: http://hdl.handle.net/11104/0183928