Počet záznamů: 1

Structure, electrical, optical and thermal properties of Ge4Sb4Tex(x=8,9 and10) thin films

  1. 1.
    0340236 - UMCH-V 2010 RIV NL eng J - Článek v odborném periodiku
    Přikryl, J. - Hrdlička, M. - Frumar, M. - Orava, J. - Beneš, L. - Vlček, Milan - Kostal, P. - Hromádko, T. - Wágner, T.
    Structure, electrical, optical and thermal properties of Ge4Sb4Tex(x=8,9 and10) thin films.
    Journal of Non-Crystalline Solids. Roč. 355, 37-42 (2009), s. 1998-2002 ISSN 0022-3093.
    [International Symposium on Non-Oxide and New Optical Glasses. Montpellier, 20.04.2008-25.04.2008]
    Grant CEP: GA ČR GA203/06/0627
    Klíčová slova: chalcogenide thin films * crystallization
    Kód oboru RIV: CA - Anorganická chemie
    Impakt faktor: 1.252, rok: 2009

    The crystalline samples were prepared and their amorphous semiconducting thin films obtained by flash evaporation. The films were crystallized by a short laser pulses or slowly by annealing. The electrical and optical properties of layers prepared were measured.
    Trvalý link: http://hdl.handle.net/11104/0183523