Počet záznamů: 1

New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors

  1. 1.
    0339531 - FZU-D 2010 RIV US eng J - Článek v odborném periodiku
    Sadewasser, S. - Jelínek, Pavel - Fang, Ch.-K. - Custance, Ó. - Yamada, Y. - Sugimoto, Y. - Abe, M. - Morita, S.
    New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
    Physical Review Letters. Roč. 103, č. 26 (2009), 266103/1-266103/4 ISSN 0031-9007
    Grant CEP: GA ČR GA202/09/0545; GA AV ČR IAA100100905
    Výzkumný záměr: CEZ:AV0Z10100521
    Klíčová slova: KPFM * atomic force microscopy * DFT * atomic resolution * semiconductor surface
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 7.328, rok: 2009

    We present dynamic force-microscopy experiment and first-principles simulations that contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy (KPFM) images of semiconductor surfaces.
    Trvalý link: http://hdl.handle.net/11104/0183034