Počet záznamů: 1

Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy

  1. 1.
    0335296 - UPT-D 2011 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
    Müllerová, Ilona - Hovorka, Miloš - Fořt, Tomáš - Frank, Luděk
    Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy.
    Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 22. ISBN 978-80-254-4535-8.
    [CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
    Grant CEP: GA AV ČR IAA100650902
    Výzkumný záměr: CEZ:AV0Z20650511
    Klíčová slova: transmission electron microscope * scanning low energy electron microscopes
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    For examination of thin films by transmitted electrons (TE) the Transmission Electron Microscope is used at primary beam energies in hundreds of keV. The Scanning Electron Microscopes (SEM) utilize reflected electrons in order to image surfaces but recently the TE mode has been introduced into SEM at much lower electron energies.
    Trvalý link: http://hdl.handle.net/11104/0179802