Počet záznamů: 1
Calculation of aberration coefficients by ray tracing
- 1. 0333615 - UPT-D 2010 RIV NL eng J - Článek v odborném periodiku
Oral, Martin - Lencová, Bohumila
Calculation of aberration coefficients by ray tracing.
Ultramicroscopy. Roč. 109, č. 11 (2009), s. 1365-1373 ISSN 0304-3991
Grant CEP: GA AV ČR IAA100650805
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: Aberrations * Aberration coefficients * Ray tracing * Regression * Fitting
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 2.067, rok: 2009
We present an approach for the calculation of aberration coefficients using accurate ray tracing. For a given optical system, intersections of a large number of trajectories with a given plane are computed. In the Gaussian image plane the imaging with the selected optical system can be described by paraxial and aberration coefficients (geometric and chromatic) that can be calculated by least-squares fitting of the analytical model on the computed trajectory positions. An advantage of such a way of computing the aberration coefficients is that, in comparison with the aberration integrals and the differential algebra method, it is relatively easy to use and its complexity stays almost constant with the growing complexity of the optical system. This paper shows a tested procedure for choosing proper initial conditions and computing the coefficients of the fifth-order geometrical and third-order, first-degree chromatic aberrations by ray tracing on an example of a weak electrostatic lens.
Trvalý link: http://hdl.handle.net/11104/0178557