Search results
- 1.0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Graphene examined with very slow electrons.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252038