Search results

  1. 1.
    0510308 - ÚPT 2020 US eng A - Abstract
    Materna Mikmeková, Eliška - Frank, Luděk - Konvalina, Ivo - Müllerová, Ilona - Zhang, T. - Asefa, T.
    Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 500-501. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR TG03010046
    Institutional support: RVO:68081731
    Keywords : ultra-low energy * spectroscopy * contamination mitigation strategy
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0300817
     
     
  2. 2.
    0501301 - ÚPT 2019 GB eng A - Abstract
    Frank, Luděk - Mikmeková, Eliška
    Ultra-low energy SEM/STEM of graphene.
    19th World Congress on Material Science and Engineering. Proceedings. Vol. S7. London: Omics International, 2018. s. 141-142. ISSN 2169-0022.
    [World Congress on Materials Science and Engineering /19./. 11.06.2018-13.06.2018, Barcelona]
    Institutional support: RVO:68081731
    Keywords : ultra-low energy * SEM * STEM * graphene
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0293291
     
     
  3. 3.
    0493331 - ÚPT 2019 US eng A - Abstract
    Mikmeková, Eliška - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Daniel, Benjamin - Konvalina, Ivo - Řiháček, Tomáš - Zouhar, Martin - Zaporozchenko, A. - Lejeune, M.
    Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 24, S1 (2018), s. 1564-1565. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : low and ultra-low energy * SEM * 2D transition metal dichalcogenides * experiments and simulations
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0286714
     
     
  4. 4.
    0481338 - ÚPT 2018 CN eng A - Abstract
    Mikmeková, Eliška - Paták, Aleš - Frank, Luděk - Sluyterman, S.
    Scanning Ultra-Low-Energy Electron Microscopy of 2D Crystals.
    BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 224.
    [BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
    Institutional support: RVO:68081731
    Keywords : ultra-Low-Energy Electron Microscopy * scanning * 2D Crystals
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0276916
     
     
  5. 5.
    0459573 - ÚPT 2017 RIV CH eng J - Journal Article
    Mikmeková, Eliška - Frank, Luděk - Müllerová, Ilona - Li, B. W. - Ruoff, R. S. - Lejeune, M.
    Study of multi-layered graphene by ultra-low energy SEM/STEM.
    Diamond and Related Materials. Roč. 63, March 2016 (2016), s. 136-142. ISSN 0925-9635. E-ISSN 1879-0062
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : scanning ultra low energy electron microscopy * graphene * contamination * CVD
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.561, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0259759
     
     
  6. 6.
    0450919 - ÚPT 2016 CZ eng A - Abstract
    Mikmeková, Eliška - Frank, Luděk
    Ultralow energy STEM of graphene.
    Mikroskopie 2015. Praha: Československá mikroskopická společnost, 2015. s. 34-35.
    [Mikroskopie 2015. 12.05.2015-13.05.2015, Lednice]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : ultra low energy * graphene
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252232
     
     
  7. 7.
    0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Eliška
    Graphene examined with very slow electrons.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252038
     
     
  8. 8.
    0422788 - ÚPT 2014 CZ eng K - Conference Paper (Czech conference)
    Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Müllerová, Ilona
    Very low energy STEM for biology.
    Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 19.
    [Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
    R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731 ; RVO:60077344
    Keywords : tissue sections * ultra-low-energy STEM * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0229236
     
     


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