Search results
- 1.0205670 - UPT-D 20030052 RIV US eng J - Journal Article
Zobačová, Jitka - Frank, Luděk
Specimen Charging and Detection of Signal from Non-conductors in a Cathode Lens-Equipped Scanning Electron Microscope.
Scanning. Roč. 25, č. 3 (2003), s. 150 - 156. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR IBS2065017
Institutional research plan: CEZ:AV0Z2065902
Keywords : nonconductive specimens * specimen charging * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.733, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101283 - 2.0205398 - UPT-D 20010038 RIV US eng J - Journal Article
Frank, Luděk - Müllerová, Ilona - Zobačová, Jitka
Imaging of Unstained and Uncoated Specimens in the Scanning Electron Microscope at Optimum Electron Energy.
Scanning. Roč. 23, č. 6 (2001), s. 116. ISSN 0161-0457. E-ISSN 1932-8745
Institutional research plan: CEZ:AV0Z2065902
Keywords : nonconductive specimens * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0101012 - 3.0205377 - UPT-D 20010016 RIV US eng J - Journal Article
Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System.
Scanning. Roč. 23, č. 1 (2001), s. 36-50. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA ČR GA202/96/0961; GA ČR GA202/99/0008
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * specimen charging * nonconductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.389, year: 2001
Permanent Link: http://hdl.handle.net/11104/0100991