Search results

  1. 1.
    0498823 - ÚPT 2019 RIV CZ cze K - Conference Paper (Czech conference)
    Jedlička, Petr - Mikel, Břetislav - Řeřucha, Šimon - Matěj, Z. - Herman, O. - Holá, Miroslava - Jelínek, Michal - Pavelka, Jan - Číp, Ondřej - Lazar, Josef
    Interferometrický kalibrátor pro měření vlnových délek.
    [Interferometric System for Length Calibration on a Metre Scale.]
    Sborník příspěvků multioborové konference LASER58. Brno: Ústav přístrojové techniky AV ČR, 2018 - (Růžička, B.), s. 31-32. ISBN 978-80-87441-24-4.
    [LASER58. Třešť (CZ), 17.10.2018-19.10.2018]
    R&D Projects: GA MŠMT(CZ) LO1212; GA MPO(CZ) FV10336; GA MŠMT ED0017/01/01; GA TA ČR TE01020233; GA MV VI20172020099
    Institutional support: RVO:68081731
    Keywords : laser interferometry * optical metrology * nanometrology
    OECD category: Optics (including laser optics and quantum optics)
    Permanent Link: http://hdl.handle.net/11104/0291706
     
     
  2. 2.
    0468858 - ÚPT 2017 RIV US eng C - Conference Paper (international conference)
    Holá, Miroslava - Lazar, Josef - Čížek, Martin - Hucl, Václav - Řeřucha, Šimon - Číp, Ondřej
    Coordinate interferometric system for measuring the position of a sample with infrared telecom laser diode.
    Optics and Measurement International Conference 2016 (Proceedings of SPIE 10151). Bellingham: SPIE, 2016, s. 1-4, č. článku 101510X. ISSN 0277-786X.
    [Optics and Measurement International Conference 2016. Liberec (CZ), 11.09.2016-14.09.2016]
    R&D Projects: GA ČR GB14-36681G; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT EE2.3.30.0054
    Institutional support: RVO:68081731
    Keywords : nanometrology * interferometry * position sensing
    OECD category: Optics (including laser optics and quantum optics)
    Permanent Link: http://hdl.handle.net/11104/0266685
     
     
  3. 3.
    0468529 - ÚPT 2017 RIV US eng C - Conference Paper (international conference)
    Řeřucha, Šimon - Šarbort, Martin - Holá, Miroslava - Čížek, Martin - Hucl, Václav - Číp, Ondřej - Lazar, Josef
    Digital algorithms for parallel pipelined single detector homodyne fringe counting in laser interferometry.
    20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proceedings of SPIE 10142). Bellingham: SPIE, 2016, s. 1-11, č. článku 101420Z. ISSN 0277-786X.
    [Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /20./. Jasná (SK), 05.09.2016-09.09.2016]
    R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : laser interferometry * displacement measurement * optical metrology * nanometrology * homodyne detection * scale linerization
    Subject RIV: BH - Optics, Masers, Lasers
    http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2595371
    Permanent Link: http://hdl.handle.net/11104/0266504
     
     
  4. 4.
    0467527 - ÚPT 2017 PL eng A - Abstract
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Oulehla, Jindřich - Číp, Ondřej - Valtr, M. - Klapetek, P.
    Coordinate interferometric measuring system for positioning of a sample in electron-beam writer.
    NanoScale 2016. 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods. Wroclaw: Wroclaw University of Technology, 2016.
    [NanoScale 2016. Seminar on Quantitative Microscopy (QM) /11./ and Seminar on Nanoscale Calibration Standards and Methods /7./. 09.03.2016-11.03.2016, Wroclaw]
    Institutional support: RVO:68081731
    Keywords : SPM * nanometrology * nanoscale * nanopositioning interferometry
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0265623
     
     
  5. 5.
    0464547 - ÚPT 2017 RIV GB eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Čížek, Martin - Hucl, Václav - Řeřucha, Šimon - Číp, Ondřej
    Coordinate interferometric measurement with infrared telecom laser diode.
    EUSPEN 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Nottingham: Euspen, 2016, P1.58.1-P1.58.3. ISBN 978-095667908-6.
    [EUSPEN 2016. International Conference of the European Society for Precision Engineering and Nanotechnology /16./. Nottingham (GB), 30.05.2016-03.06.2016]
    R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : interferometry * nanometrology * position sensing
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0265159
     
     
  6. 6.
    0452397 - ÚPT 2016 RIV CZ cze J - Journal Article
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Oulehla, Jindřich - Číp, Ondřej - Vychodil, M. - Sedlář, P. - Provazník, M.
    Pokročilé interferometrické systémy pro měření polohy v nanometrologii.
    [Advanced interferometry systems for dimensional measurement in nanometrology.]
    Jemná mechanika a optika. Roč. 60, č. 1 (2015), s. 14-17. ISSN 0447-6441
    R&D Projects: GA ČR GB14-36681G; GA TA ČR TA02010711; GA TA ČR TA01010995; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : interferometry systems * dimensional measurement * nanometrology
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0253412
     
     
  7. 7.
    0451092 - FZÚ 2020 RIV CZ eng C - Conference Paper (international conference)
    Holá, M. - Hrabina, J. - Číp, O. - Fejfar, Antonín - Stuchlík, Jiří - Kočka, Jan - Oulehla, J. - Lazar, J.
    Nanopositioning with detection of a standing wave.
    NANOCON 2013. 5th International conference proceedings. Ostrava: TANGER Ltd, 2014, s. 792-796. ISBN 978-80-87294-47-5.
    [NANOCON 2013. International Conference /5./. Brno (CZ), 16.10.2013-18.10.2013]
    R&D Projects: GA MŠMT(CZ) LM2011026
    Institutional support: RVO:68378271
    Keywords : nanometrology * nanopositioning * Fabry-Perot cavity * standing wave * interferometry
    OECD category: Optics (including laser optics and quantum optics)
    Permanent Link: http://hdl.handle.net/11104/0252273
     
     
  8. 8.
    0449486 - ÚPT 2016 RIV SK eng J - Journal Article
    Holá, Miroslava - Hrabina, Jan - Šarbort, Martin - Oulehla, Jindřich - Číp, Ondřej - Lazar, Josef
    Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry.
    Measurement Science Review. Roč. 15, č. 5 (2015), s. 263-267. ISSN 1335-8871. E-ISSN 1335-8871
    R&D Projects: GA ČR GB14-36681G; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT EE2.3.30.0054
    Institutional support: RVO:68081731
    Keywords : nanometrology * interferometry * refractive index of air
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 0.969, year: 2015
    Permanent Link: http://hdl.handle.net/11104/0251067
     
     
  9. 9.
    0447554 - ÚPT 2016 RIV US eng C - Conference Paper (international conference)
    Martínek, T. - Kudělka, J. - Navrátil, M. - Křesálek, V. - Fejfar, Antonín - Hývl, Matěj - Sobota, Jaroslav
    Nanoscale Characterization of Ultra-thin Tungsten Films Deposited by Radio-Frequency Magnetron Sputtering.
    IEEE NANO 2015 Proceedings. 15th International Conference on Nanotechnology. Danvers: IEEE, 2015. ISBN 978-1-4673-8156-7.
    [IEEE NANO 2015. International Conference on Nanotechnology /15/. Rome (IT), 27.07.2015-30.07.2015]
    Institutional support: RVO:68081731 ; RVO:68378271
    Keywords : atomic force microscopy * tungsten * ultra-thin film * nanocharacterization * nanometrology
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252386
     
     
  10. 10.
    0444439 - ÚPT 2016 RIV CH eng J - Journal Article
    Lazar, Josef - Klapetek, P. - Valtr, M. - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej - Čížek, Martin - Oulehla, Jindřich - Šerý, Mojmír
    Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy.
    Sensors. Roč. 14, č. 1 (2014), s. 877-886. E-ISSN 1424-8220
    R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : nanometrology * nanopositioning interferometry * AFM * nanoscale
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 2.245, year: 2014
    Permanent Link: http://hdl.handle.net/11104/0246959
     
     

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