Search results
- 1.0572170 - ÚPT 2024 RIV CH eng J - Journal Article
Mrázová, Kateřina - Bačovský, J. - Šedrlová, Z. - Slaninová, E. - Obruča, S. - Fritz, I. - Krzyžánek, Vladislav
Urany-Less Low Voltage Transmission Electron Microscopy: A Powerful Tool for Ultrastructural Studying of Cyanobacterial Cells.
Microorganisms. Roč. 11, č. 4 (2023), č. článku 888. E-ISSN 2076-2607
R&D Projects: GA ČR(CZ) GF19-29651L; GA MŠMT(CZ) LM2023050
Institutional support: RVO:68081731
Keywords : low voltage electron microscopy * uranyl acetate * contrasting agents * transmission electron microscopy * Synechocystis * polyhydroxyalkanoates
OECD category: Electrical and electronic engineering
Impact factor: 4.5, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2076-2607/11/4/888
Permanent Link: https://hdl.handle.net/11104/0348036 - 2.0565850 - ÚPT 2023 RIV CZ cze V - Research Report
Mika, Filip
SMV-2022-04: Vypracování metodiky pro morfologickou a prvkovou analýzu experimentálních a archeologických vzorků kostí a sedimentů na rastrovacím elektronovém mikroskopu.
[SMV-2022-04: Method for morphological and elemental analysis of experimental and archeological bone and sediment samples using a scanning electronmicroscope.]
Brno: Archeologický ústav AV ČR Brno, v. v. i., 2022. 4 s.
Source of funding: N - Non-public resources
Keywords : morphology * scanning electron microscopy * low-voltage electron microscopy
OECD category: Materials engineering
Permanent Link: https://hdl.handle.net/11104/0337341 - 3.0549979 - ÚPT 2022 RIV CZ cze V - Research Report
Mika, Filip
SMV-2021-36: Vypracování metodiky pro morfologickou analýzu experimentálních a archeologických vzorků kostí na rastrovacím elektronovém mikroskopu.
[SMV-2021-36: Method for morphological analysis of experimental and archeological bone samples using a scanning electronmicroscope.]
Brno: Univerzita Hradec Králové, 2021. 20 s.
Source of funding: N - Non-public resources
Keywords : morphology * scanning electron microscopy * low-voltage electron microscopy
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0325860 - 4.0481591 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk - Polčák, J. - Paták, Aleš - Lejeune, M.
Examination of 2D crystals in a low voltage SEM/STEM.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 618-619. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low voltage SEM/STEM * 2D crystals * contamination
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0277164 - 5.0474534 - ÚMCH 2018 CZ eng A - Abstract
Šlouf, Miroslav - Pavlova, Ewa - Hromádková, Jiřina - Coufalová, E. - Kolařík, V. - Wandrol, P.
CTEM, LVTEM and FEGSEM microscopy of metal nanoparticles for multiple immunolabeling.
Mikroskopie 2017. Praha: Československá mikroskopická společnost, 2017. s. 37.
[Mikroskopie 2017. 09.05.2017-10.05.2017, Bratislava]
R&D Projects: GA TA ČR(CZ) TE01020118; GA ČR(CZ) GA17-05007S; GA MŠMT(CZ) LO1507
Institutional support: RVO:61389013
Keywords : low voltage TEM microscopy * nanoparticles * markers
Subject RIV: CD - Macromolecular Chemistry
Permanent Link: http://hdl.handle.net/11104/0271682 - 6.0466095 - ÚPT 2017 CZ eng A - Abstract
Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Temperature dependent mass loss of Epon resin sections, p 56 Keywords: Epon resin, mass loss, radiation damage, low voltage STEM, temperature.
Mikroskopie 2016. Praha: Československá mikroskopická společnost, 2016. s. 56.
[Mikroskopie 2016. 03.05.2016-04.05.2016, Lednice]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : epon resin * mass loss * radiation damage * low voltage STEM * temperature
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering; JA - Electronics ; Optoelectronics, Electrical Engineering (BC-A)
Permanent Link: http://hdl.handle.net/11104/0264506 - 7.0463327 - BC 2017 RIV US eng J - Journal Article
Nebesářová, Jana - Hozák, Pavel - Frank, Luděk - Štěpan, P. - Vancová, Marie
The Cutting of Ultrathin Sections With the Thickness Less Than 20 nm From Biological Specimens Embedded in Resin Blocks.
Microscopy Research and Technique. Roč. 79, č. 6 (2016), s. 512-517. ISSN 1059-910X. E-ISSN 1097-0029
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:60077344 ; RVO:68378050 ; RVO:68081731
Keywords : low voltage electron microscopy * resin embedding * ultramicrotomy * ultrathin sectioning
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.147, year: 2016
Permanent Link: http://hdl.handle.net/11104/0262542 - 8.0459065 - ÚOCHB 2017 US eng J - Journal Article
Weiss, Norbert - Lacinová, L.
T-type channels: release a brake, engage a gear.
Channels. Roč. 10, č. 2 (2016), s. 78-80. ISSN 1933-6950. E-ISSN 1933-6969
Institutional support: RVO:61388963
Keywords : gating brake * pore opening * Ca(V)3.3 * channel gating * Ca(V)3.1 * low-voltage activated calcium channels
Subject RIV: CE - Biochemistry
Impact factor: 2.042, year: 2016
Permanent Link: http://hdl.handle.net/11104/0259319 - 9.0452283 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Krzyžánek, Vladislav - Keller, U. - Sporenberg, N. - Schönhoff, M.
Structure of polyelectrolyte hollow capsules by scanning electron microscopy.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 211-212. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA ČR(CZ) GA14-20012S
Institutional support: RVO:68081731
Keywords : cryo-SEM * low voltage STEM * quantitative imaging * hollow capsules
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253308 - 10.0436622 - ÚPT 2015 RIV US eng J - Journal Article
Novotná, V. - Hrubanová, Kamila - Nebesářová, J. - Krzyžánek, Vladislav
Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 1270-1271. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212; GA ČR(CZ) GA14-20012S; GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : mass loss * mass-thickness measurement * low voltage STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240333