Search results
- 1.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S036820481830135X
Permanent Link: http://hdl.handle.net/11104/0309284 - 2.0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Graphene examined with very slow electrons.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252038 - 3.0420975 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona
Collection of signal electrons in Low Energy SEM.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 327-328.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
R&D Projects: GA MŠk EE2.4.31.0016
Institutional support: RVO:68081731
Keywords : signal collection * low energy SEM * trajectory simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0227433 - 4.0397636 - ÚPT 2014 RIV NL eng J - Journal Article
Mikmeková, Šárka - Mašek, B. - Jirková, H. - Aišman, D. - Müllerová, Ilona - Frank, Luděk
Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum.
Applied Surface Science. Roč. 275, 15 June (2013), s. 403-408. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : Very low energy SEM * Crystallographic contrast * Strain mapping * Semi-solid state processing
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.538, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225250 - 5.0387264 - ÚPT 2013 RIV GB eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Šárka - Hovorka, Miloš - Pokorná, Zuzana - Müllerová, Ilona
Overview of SEM developments and potential.
EMC 2012. Proceedings of the 15th European Microscopy Congress. vol. 2. Manchester: The Royal Microscopical Society, 2012, s. 121-122. ISBN 978-0-9502463-6-9.
[EMC 2012. European Microscopy Congress /15./. Manchester (US), 16.09.2012-21.09.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : low energy SEM * multichannel SEM * STEM in SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0216387 - 6.0385193 - ÚPT 2013 RIV CH eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
Scanning Electron Microscopy with Samples in an Electric Field.
Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠk ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.247, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214527 - 7.0352508 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
Hovorka, Miloš - Frank, Luděk
Mapping of Dopants in Silicon by Injection of Electrons.
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 15-18. ISBN 978-4-9903248-2-7.
[JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
Institutional research plan: CEZ:AV0Z20650511
Keywords : semiconductors * dopant contrast * very low energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192000 - 8.0308202 - ÚPT 2008 RIV GB eng J - Journal Article
Mika, Filip - Frank, Luděk
Two-dimensional dopant profiling with low energy SEM.
[Tvorba dvourozměrných profilů dopantu s níkoenergiovým SEM.]
Journal of Microscopy. Roč. 230, č. 1 (2008), s. 76-83. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant contrast * low energy SEM * semiconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.409, year: 2008
Permanent Link: http://hdl.handle.net/11104/0160756 - 9.0205712 - UPT-D 20030095 RIV US eng M - Monography Chapter
Müllerová, Ilona - Frank, Luděk
Scanning low energy electron microscopy.
Advances in imaging and electron physics Vol. 128. New York: Elesevier Science, 2003 - (Hawkes, P.), s. 309 - 443
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscope * low energy SEM * low energy electron beams
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101325 - 10.0205641 - UPT-D 20030023 RIV US eng J - Journal Article
Mika, Filip - Ryšávka, J. - Lopour, F. - Zadražil, M. - Müllerová, Ilona - Frank, Luděk
Computer Controlled Low Energy SEM.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 116 - 117. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IBS2065017
Institutional research plan: CEZ:AV0Z2065902
Keywords : low energy SEM * scanning electron microscope * non-conductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101254