Search results

  1. 1.
    0525062 - ÚPT 2021 RIV NL eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
    Acquisition of the dopant contrast in semiconductors with slow electrons.
    Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
    OECD category: Electrical and electronic engineering
    Impact factor: 1.957, year: 2020
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S036820481830135X
    Permanent Link: http://hdl.handle.net/11104/0309284
     
     
  2. 2.
    0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Eliška
    Graphene examined with very slow electrons.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252038
     
     
  3. 3.
    0420975 - ÚPT 2014 DE eng C - Conference Paper (international conference)
    Konvalina, Ivo - Müllerová, Ilona
    Collection of signal electrons in Low Energy SEM.
    Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 327-328.
    [Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
    R&D Projects: GA MŠk EE2.4.31.0016
    Institutional support: RVO:68081731
    Keywords : signal collection * low energy SEM * trajectory simulations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0227433
     
     
  4. 4.
    0397636 - ÚPT 2014 RIV NL eng J - Journal Article
    Mikmeková, Šárka - Mašek, B. - Jirková, H. - Aišman, D. - Müllerová, Ilona - Frank, Luděk
    Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum.
    Applied Surface Science. Roč. 275, 15 June (2013), s. 403-408. ISSN 0169-4332. E-ISSN 1873-5584
    R&D Projects: GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : Very low energy SEM * Crystallographic contrast * Strain mapping * Semi-solid state processing
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.538, year: 2013
    Permanent Link: http://hdl.handle.net/11104/0225250
     
     
  5. 5.
    0387264 - ÚPT 2013 RIV GB eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Šárka - Hovorka, Miloš - Pokorná, Zuzana - Müllerová, Ilona
    Overview of SEM developments and potential.
    EMC 2012. Proceedings of the 15th European Microscopy Congress. vol. 2. Manchester: The Royal Microscopical Society, 2012, s. 121-122. ISBN 978-0-9502463-6-9.
    [EMC 2012. European Microscopy Congress /15./. Manchester (US), 16.09.2012-21.09.2012]
    R&D Projects: GA ČR GAP108/11/2270
    Institutional support: RVO:68081731
    Keywords : low energy SEM * multichannel SEM * STEM in SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0216387
     
     
  6. 6.
    0385193 - ÚPT 2013 RIV CH eng J - Journal Article
    Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
    Scanning Electron Microscopy with Samples in an Electric Field.
    Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.247, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0214527
     
     
  7. 7.
    0352508 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
    Hovorka, Miloš - Frank, Luděk
    Mapping of Dopants in Silicon by Injection of Electrons.
    Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 15-18. ISBN 978-4-9903248-2-7.
    [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : semiconductors * dopant contrast * very low energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192000
     
     
  8. 8.
    0308202 - ÚPT 2008 RIV GB eng J - Journal Article
    Mika, Filip - Frank, Luděk
    Two-dimensional dopant profiling with low energy SEM.
    [Tvorba dvourozměrných profilů dopantu s níkoenergiovým SEM.]
    Journal of Microscopy. Roč. 230, č. 1 (2008), s. 76-83. ISSN 0022-2720. E-ISSN 1365-2818
    R&D Projects: GA ČR GA102/05/2327
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : dopant contrast * low energy SEM * semiconductors
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.409, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0160756
     
     
  9. 9.
    0205712 - UPT-D 20030095 RIV US eng M - Monography Chapter
    Müllerová, Ilona - Frank, Luděk
    Scanning low energy electron microscopy.
    Advances in imaging and electron physics Vol. 128. New York: Elesevier Science, 2003 - (Hawkes, P.), s. 309 - 443
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : scanning electron microscope * low energy SEM * low energy electron beams
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101325
     
     
  10. 10.
    0205641 - UPT-D 20030023 RIV US eng J - Journal Article
    Mika, Filip - Ryšávka, J. - Lopour, F. - Zadražil, M. - Müllerová, Ilona - Frank, Luděk
    Computer Controlled Low Energy SEM.
    Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 116 - 117. ISSN 1431-9276. E-ISSN 1435-8115.
    [MC 2003. Dresden, 07.09.2003-12.09.2003]
    R&D Projects: GA AV ČR IBS2065017
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : low energy SEM * scanning electron microscope * non-conductive specimens
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.648, year: 2003
    Permanent Link: http://hdl.handle.net/11104/0101254