Search results
- 1.0353053 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Bařinka, R. - Hladík, V. - Flodrová, Eva
Investigation of solar cell structures after laser beam processing.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 225.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/305
Institutional research plan: CEZ:AV0Z20650511
Keywords : crystalline silicon solar cells * laser confocal microscope * environmental scanning electron microscope * structures study * laser MicroJet system * fiber laser
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192401 - 2.0353052 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Krejčí, J. - Sajdlová, Z. - Flodrová, Eva
Study of surfaces of electrochemical sensors using optical and scanning electron microscopy.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 226.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/118
Institutional research plan: CEZ:AV0Z20650511
Keywords : electrochemical sensors * laser confocal microscope * environmental scanning electron microscope * surface study
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192400 - 3.0353051 - ÚPT 2011 CN eng A - Abstract
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy electrons * laser confocal microscope * free-standing ultra thin films * very low energy transmission mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192399 - 4.0350660 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 23-24. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy scanning transmission electron microscopy * ultrathin foils * laser confocal microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350660_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190600