Search results
- 1.0567527 - ÚPT 2023 CZ eng A - Abstract
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * SLEEM * inelastic mean free path
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338780 - 2.0567516 - ÚPT 2023 RIV CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna Mikmeková, Eliška
Time-of-Flight Spectrometer for Low Landing Energies.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338771 - 3.0552272 - ÚPT 2022 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
OECD category: Electrical and electronic engineering
https://ava2016-autumn.webnode.cz/
Permanent Link: http://hdl.handle.net/11104/0327405 - 4.0551131 - ÚPT 2022 RIV US eng A - Abstract
Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
OECD category: Electrical and electronic engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
Permanent Link: http://hdl.handle.net/11104/0326576 - 5.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 6.0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287642 - 7.0328517 - FZÚ 2010 RIV GB eng J - Journal Article
Zemek, Josef - Houdková, Jana - Jiříček, Petr - Jablonski, A. - Jurka, Vlastimil - Kub, Jiří
Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films.
[Stanovení středních neelastických volných drah elektronů v tenkých vrstvách polymetylfenyl silylenu.]
Polymer. Roč. 50, č. 11 (2009), s. 2445-2450. ISSN 0032-3861. E-ISSN 1873-2291
R&D Projects: GA ČR GA202/09/0428; GA AV ČR IAA100100622
Institutional research plan: CEZ:AV0Z10100521
Keywords : polymer physics * poly[methyl(phenyl)silylene] * inelastic mean free path
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.573, year: 2009
Permanent Link: http://hdl.handle.net/11104/0005425 - 8.0134659 - FZU-D 20030560 RIV US eng J - Journal Article
Jiříček, Petr - Zemek, Josef - Lejček, Pavel - Lesiak, B. - Jablonski, A. - Čerňanský, Marian
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon.
Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 20, č. 2 (2002), s. 447-455. ISSN 0734-2101. E-ISSN 1520-8559
R&D Projects: GA ČR GA202/02/0237
Institutional research plan: CEZ:AV0Z1010914
Keywords : Monte Carlo simulation * electron-solid interaction * inelastic mean free path(IMFP) * elastic peak electron spectroscopy(EPES)
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.301, year: 2002
Permanent Link: http://hdl.handle.net/11104/0032553 - 9.0109042 - UPT-D 20040043 RIV CZ eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Müllerová, Ilona
Very Low Energy Scanning Electron Microscopy.
[Rastrovací elektronová mikroskopie pomalými elektrony.]
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 33-34. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : low energy electrons, * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016154 - 10.0109027 - UPT-D 20040028 RIV BE eng C - Conference Paper (international conference)
Hrnčiřík, Petr - Křivánek, O. - Müllerová, Ilona
Very low energy scanning transmission electron microscopy.
[Rastrovací prozařovací elektronová mikroskopie pomalými elektrony.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 333-334.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR KJB2065405
Keywords : energy electrons * inelastic mean free path * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016139