Search results
- 1.0398028 - ÚPT 2014 RIV US eng J - Journal Article
Frank, Luděk - Mikmeková, Šárka - Pokorná, Zuzana - Müllerová, Ilona
Scanning Electron Microscopy With Slow Electrons.
Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 372-373. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : Scanning Electron Microscopy * Slow Electrons * Grain Contrast * Contrast of the Density of States * Angle-resolved BSE
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.161, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225603 - 2.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 3.0368827 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
Scanning Very Low Energy Electron Microscopy.
NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
[NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0203060 - 4.0367773 - ÚPT 2012 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
Unconventional Imaging with Backscattered Electrons.
Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 900-901. ISSN 1431-9276. E-ISSN 1435-8115
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * low energies * grain contrast * dopant contrast * internal stress
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.007, year: 2011
Permanent Link: http://hdl.handle.net/11104/0202327 - 5.0367235 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Frank, Luděk - Pokorná, Zuzana - Mikmeková, Šárka - Müllerová, Ilona
Backscattered electrons in the SEM imaging.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 65-66.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP108/11/2270
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * BSE * low energy * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201981 - 6.0358595 - ÚPT 2012 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
Very low energy scanning electron microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196580 - 7.0340746 - ÚPT 2010 RIV JP eng J - Journal Article
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Man, O. - Pantělejev, L. - Frank, Luděk
Grain Contrast Imaging in UHV SLEEM.
Materials Transactions. Roč. 51, č. 2 (2010), s. 292-296. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * electron backscatter diffraction (EBSD) * grain contrast * ultra-fine grained materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/292.html
Permanent Link: http://hdl.handle.net/11104/0183927 - 8.0335272 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Man, O. - Pantělejev, L.
Microstructure of the ultra-fine grained Cu by UHV SLEEM.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 3: 515-516. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * EBSD * grain contrast in SEM * ultrafine grained materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/25482.pdf
Permanent Link: http://hdl.handle.net/11104/0179781 - 9.0308385 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Grain Contrast in Very Low Energy SEM.
[Kontrast zrn na velmi nízkých energiích v REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 63-64. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : grain contrast * very low energy * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0160884