Search results
- 1.0549399 - ÚPT 2022 RIV NL eng J - Journal Article
Stopka, Jan - Zuidema, W. - Kruit, P.
Trajectory displacement in a multi beam scanning electron microscope.
Ultramicroscopy. Roč. 223, April (2021), č. článku 113223. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : Trajectory displacement * Multi-beam electron microscope * Coulomb interactions * Slice method * Electron optics
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.994, year: 2021
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S030439912100019X
Permanent Link: http://hdl.handle.net/11104/0325417 - 2.0534937 - ÚPT 2021 RIV NL eng J - Journal Article
Stopka, Jan
Analytical formulae for trajectory displacement in electron beam and generalized slice method.
Ultramicroscopy. Roč. 217, OCT (2020), č. článku 113050. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : coulomb interaction * trajectory displacement * electron optics * slice method * Holtzmark regime * pencil-beam regime
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.689, year: 2020
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/abs/pii/S0304399120302011
Permanent Link: http://hdl.handle.net/11104/0313066 - 3.0525191 - ÚPT 2021 RIV SK eng J - Journal Article
Matějka, Milan - Krátký, Stanislav - Řiháček, Tomáš - Knápek, Alexandr - Kolařík, Vladimír
Functional nano-structuring of thin silicon nitride membranes.
Journal of Electrical Engineering - Elektrotechnický časopis. Roč. 71, č. 2 (2020), s. 127-130. ISSN 1335-3632. E-ISSN 1339-309X
R&D Projects: GA TA ČR(CZ) TN01000008; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : membrane * nano optical device * electron optics * electron beam lithography * silicon nitride * reactive ion etching * silicon etching * microfabrication
OECD category: Nano-processes (applications on nano-scale)
Impact factor: 0.647, year: 2020
Method of publishing: Open access
https://content.sciendo.com/view/journals/jee/71/2/article-p127.xml
Permanent Link: http://hdl.handle.net/11104/0309382 - 4.0524976 - ÚPT 2021 RIV SG eng J - Journal Article
Stopka, Jan - Kruit, P.
Statistical Coulomb interactions in multi-beam SEM.
International Journal of Modern Physics. A. Roč. 34, č. 36 (2019), č. článku 1942021. ISSN 0217-751X. E-ISSN 1793-656X
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : coulomb interactions * trajectory displacement * multi-beam SEM * electron optics * slice method
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.486, year: 2019
Method of publishing: Limited access
https://www.worldscientific.com/doi/10.1142/S0217751X19420211
Permanent Link: http://hdl.handle.net/11104/0309187 - 5.0518486 - ÚPT 2020 RIV CZ cze V - Research Report
Radlička, Tomáš
SMV-2019-64: Cs korektor realizovaný pomocí kombinace anulární a kruhové apertury.
[SMV-2019-64: Circular annular Cs Corrector.]
Brno: Thermo Fisher Scientific Brno s.r.o., 2019. 2 s.
Source of funding: N - Non-public resources
Keywords : electron optics * Cs corrector * resolutions
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0303620 - 6.0508150 - ÚPT 2020 RIV NL eng J - Journal Article
Radlička, Tomáš
Correction of parasitic aberrations of hexapole corrector using differential algebra method.
Ultramicroscopy. Roč. 204, SEP (2019), s. 81-90. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * correctors * aberrations * differential algebra method
OECD category: Electrical and electronic engineering
Impact factor: 2.452, year: 2019
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S030439911930035X?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0299133 - 7.0499163 - ÚPT 2019 RIV CZ cze V - Research Report
Radlička, Tomáš
SMV-2018-21: Výpočet optiky XPS zdroje.
[SMV-2018-21: Calculation of electron optical properties of XPS source.]
Brno: FEI CZECH REPUBLIC, 2018. 5 s.
Source of funding: N - Non-public resources
Keywords : thermoemionic electron gun * space-charge * electron optics
OECD category: Communication engineering and systems
Permanent Link: http://hdl.handle.net/11104/0291422 - 8.0491708 - ÚPT 2019 RIV NL eng J - Journal Article
Radlička, Tomáš - Unčovský, M. - Oral, Martin
In lens BSE detector with energy filtering.
Ultramicroscopy. Roč. 189, JUN (2018), s. 102-108. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * scanning electron microscopy * back scattered electrons * energy filtering
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0285349 - 9.0487293 - FZÚ 2018 US eng A - Abstract
Wunderlich, J. - Janda, T. - Roy, P.E. - Ramsay, A.J. - Otxoa, R.M. - Irvine, A.C. - Jungwirth, Tomáš - Něměc, P. - Gallagher, B. L. - Campion, R. P.
Piezoelectric and photon helicity dependent domain wall motion driven by electrical current and optical spin transfer torques.
IEEE International Magnetics Conference (INTERMAG 2015). Piscataway: IEEE Inc., 2015. ISBN 978-1-4799-7321-7. ISSN 2150-4598. E-ISSN 2150-4601.
[IEEE International Magnetics Conference (Intermag) 2015. 11.05.2015-15.05.2015, Peking]
Institutional support: RVO:68378271
Keywords : electron optics * optical films * optical polarization * physics * magnetic domain walls * photonics
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Permanent Link: http://hdl.handle.net/11104/0281947 - 10.0468460 - ÚPT 2017 RIV CZ cze V - Research Report
Radlička, Tomáš
SMV-2016-21: DA modul pro EOD.
[SMV-2016-21: DA modul for EOD.]
Brno: Ing. Jakub Zlámal, Ph.D., 2016. 4 s.
Source of funding: N - Non-public resources
Keywords : electron optics * differential algebraic method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0266309