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  1. 1.
    0543080 - FZÚ 2022 RIV SK eng J - Journal Article
    Staněk, J. - Kopeček, Jaromír - Král, Petr - Karafiátová, I. - Seitl, F. - Beneš, V.
    Comparison of segmentation of 2D and 3D EBSD measurements in polycrystalline materials.
    Kovové materiály. Roč. 58, č. 5 (2020), s. 301-319. ISSN 0023-432X. E-ISSN 1338-4252
    R&D Projects: GA ČR GC17-00393J
    Institutional support: RVO:68378271 ; RVO:68081723
    Keywords : microstructure * electron backscatter diffraction (EBSD) * grain boundaries * misorientation * tessellation
    OECD category: Materials engineering; Materials engineering (UFM-A)
    Impact factor: 1.068, year: 2020
    Method of publishing: Open access
    Permanent Link: http://hdl.handle.net/11104/0322251
    FileDownloadSizeCommentaryVersionAccess
    0543080.pdf13 MBPublisher’s postprintopen-access
     
     
  2. 2.
    0340746 - ÚPT 2010 RIV JP eng J - Journal Article
    Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Man, O. - Pantělejev, L. - Frank, Luděk
    Grain Contrast Imaging in UHV SLEEM.
    Materials Transactions. Roč. 51, č. 2 (2010), s. 292-296. ISSN 1345-9678. E-ISSN 1347-5320
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning low energy electron microscopy * electron backscatter diffraction (EBSD) * grain contrast * ultra-fine grained materials
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 0.779, year: 2010
    http://www.jim.or.jp/journal/e/51/02/292.html
    Permanent Link: http://hdl.handle.net/11104/0183927
     
     


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