Search results
- 1.0333617 - ÚPT 2010 RIV GB eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo
Collection of secondary electrons in scanning electron microscopes.
Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA MŠMT OE08012; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection of electrons * magnetic lenses * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.612, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178559 - 2.0082250 - ÚPT 2007 RIV JP eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo - Frank, Luděk
Acquisition of the Angular Distribution of Backscattered Electrons at Low Energies.
[Snímání úhlového rozdělení zpětně odražených elektronů při nízkých energiích.]
Materials Transactions. Roč. 48, č. 5 (2007), s. 940-943. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA ČR GA102/05/2327; GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : angular distribution of backscattered electrons * scanning electron microscopy * low energy electron microscopy * cathode lens principle * multichannel detection of electrons * crystallinic contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.018, year: 2007
Permanent Link: http://hdl.handle.net/11104/0145866