Search results
- 1.0581954 - ÚFP 2024 RIV NL eng J - Journal Article
Shetty, N. - Veis, M. - Atikukke, S. - Bartoň, Petr - Jeřáb, Martin - Dejarnac, Renaud - Veis, P.
Depth profile CF LIBS analysis of the wall deposited layer in the COMPASS tokamak after LiSn testing campaign.
Nuclear Materials and Energy. Roč. 37, December (2023), č. článku 101547. E-ISSN 2352-1791
Institutional support: RVO:61389021
Keywords : Calibration free (CF) approach * Deposited layer analysis * Depth profile * Fusion plasma wall interaction * Laser-induced breakdown spectroscopy (LIBS) * Li and Sn migration * Liquid metal divertor (LMD)
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 2.6, year: 2022
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S2352179123001862?via%3Dihub
Permanent Link: https://hdl.handle.net/11104/0350093 - 2.0520350 - FZÚ 2020 RIV NL eng J - Journal Article
Zemek, Josef - Houdková, Jana - Jiříček, Petr - Ižák, Tibor - Kalbáč, Martin
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy.
Applied Surface Science. Roč. 491, Oct (2019), s. 16-23. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA MŠMT(CZ) EF16_019/0000760; GA MŠMT(CZ) LM2015088; GA ČR GF16-34856L; GA MŠMT(CZ) LTC18039
Grant - others:OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institutional support: RVO:68378271 ; RVO:61388955
Keywords : single-layer graphene * Raman spectroscopy * X-ray-induced Auger electron spectroscopy (XAES) * angular-resolved core-level photoelectron spectroscopy (ARXPS) * maximum entropy method * concentration depth profile reconstruction
OECD category: Condensed matter physics (including formerly solid state physics, supercond.); Physical chemistry (UFCH-W)
Impact factor: 6.182, year: 2019
Method of publishing: Limited access
https://doi.org/10.1016/j.apsusc.2019.06.083
Permanent Link: http://hdl.handle.net/11104/0305033File Download Size Commentary Version Access 0520350.pdf 1 910.5 KB Publisher’s postprint require - 3.0392014 - FZÚ 2014 RIV GB eng J - Journal Article
Aulika, I. - Mergen, S. - Bencan, A. - Zhang, Q. - Dejneka, Alexandr - Kosec, M. - Kundzins, K. - Demarchi, D. - Civera, P.
Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films.
Advances in Applied Ceramics. Roč. 112, č. 1 (2013), s. 53-58. ISSN 1743-6753. E-ISSN 1743-6761
R&D Projects: GA TA ČR TA01010517; GA ČR GAP108/12/1941
Institutional research plan: CEZ:AV0Z10100522
Keywords : compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.107, year: 2013
Permanent Link: http://hdl.handle.net/11104/0220997 - 4.0317966 - FZÚ 2009 RIV NL eng J - Journal Article
Životský, O. - Postava, K. - Hrabovská, K. - Hendrych, A. - Pištora, J. - Kraus, Luděk
Depth-sensitive characterization of surface magnetic properties of as-quenched FeNbB ribbons.
[Hloubkově citlivá charakterizace povrchových magnetických vlastností rychle chlazených pásků FeNbB.]
Applied Surface Science. Roč. 255, č. 5 (2008), 3322-3327. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GA102/08/0743
Grant - others:GA ČR(CZ) GA202/06/0531
Institutional research plan: CEZ:AV0Z10100520
Keywords : amorphous and nanocrystalline magnetic materials * magneto-optíc Kerr effect * scanning electron microscopy * depth profile
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.576, year: 2008
Permanent Link: http://hdl.handle.net/11104/0004952 - 5.0306993 - ÚFM 2008 RIV NL eng J - Journal Article
Životský, O. - Postava, K. - Kraus, Luděk - Juraszek, J. - Jirásková, Yvonna - Teillet, J. - Barčová, K. - Švec, P. - Janičkovič, D. - Pištora, J.
Surface and bulk magnetic properties of as-quenched FeNbB ribbons.
[Povrchové a objemové magnetické vlastnosti pásku FeNbB v počátečním stavu.]
Journal of Magnetism and Magnetic Materials. Roč. 320, č. 8 (2008), s. 1535-1540. ISSN 0304-8853. E-ISSN 1873-4766
R&D Projects: GA ČR GA202/05/2111; GA AV ČR KAN400100653
Institutional research plan: CEZ:AV0Z20410507; CEZ:AV0Z10100520
Keywords : Surface nanocrystallization * Fe-based ribbon * depth profile
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.283, year: 2008
Permanent Link: http://hdl.handle.net/11104/0159867 - 6.0305944 - FZÚ 2008 RIV US eng C - Conference Paper (international conference)
Životský, O. - Postava, K. - Kraus, Luděk - Hrabovská, K. - Pištora, J.
Depth sensitivity of magneto-optic Kerr effect on FeNbB amorphous ribbons.
[Hloubková citlivost magneto-optického Kerrova jevu v amorfních páscích FeNbB.]
Optical Sensing Technology and Applications. Bellingham: SPIE - The International Society for Optical Engineering, 2007 - (Baldini, F.; Homola, J.; Liberman, R.; Miler, M.), 65851P/1-65851P/8. Proceedings of SPIE, Vol. 6585. ISBN 978-0-8194-6713-3. ISSN 0277-786X.
[Optics and Optoelectronics. Praha (CZ), 16.04.2007-19.04.2007]
R&D Projects: GA AV ČR KAN400100653
Grant - others:GA ČR(CZ) GA202/06/0531
Institutional research plan: CEZ:AV0Z10100520
Keywords : depth profile * magneto-optic vector magnetometry * Fe-based ribbons
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0159067 - 7.0133692 - FZU-D 20010492 RIV GB eng J - Journal Article
Deineka, Alexander - Glinchuk, M. D. - Jastrabík, Lubomír - Suchaneck, G. - Gerlach, G.
Nondestructive investigatons of the depth profile of PZT ferroelectric films.
Ferroelectrics. Roč. 264, - (2001), s. 151-156. ISSN 0015-0193. E-ISSN 1563-5112
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : ferroelectric film * depth profile * interface
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.471, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031654 - 8.0133690 - FZU-D 20010490 RIV GB eng J - Journal Article
Deineka, Alexander - Glinchuk, M. D. - Jastrabík, Lubomír - Suchaneck, G. - Gerlach, G.
Ellipsometry investigation of perovskite/pyrochlore PZT thin film stacks.
Ferroelectrics. Roč. 258, - (2001), s. 271-276. ISSN 0015-0193. E-ISSN 1563-5112
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : ferroelectric film * depth profile * interface
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.471, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031653 - 9.0133423 - FZU-D 20010275 RIV GB eng J - Journal Article
Deineka, Alexander - Glinchuk, M. D. - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G.
Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air.
Ferroelectrics. Roč. 254, - (2001), s. 205-211. ISSN 0015-0193. E-ISSN 1563-5112
R&D Projects: GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : ferroelecric film * depth profile * interface interaction
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.471, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031392 - 10.0030897 - FZÚ 2006 RIV NL eng J - Journal Article
Životský, O. - Postava, K. - Kraus, Luděk - Malátek, M. - Janičkovič, D. - Ciprian, D. - Luňáček, J. - Pištora, J.
Surface crystallized Co66Fe4 B15Si15 amorphous ribbons studied using magneto-optical magnetometry.
[Povrchově kriystalizované amofní pásky Co66Fe4 B15Si15 studované pomocí magneto-optické magnetometrie.]
Journal of Magnetism and Magnetic Materials. 290-291, Part 1 (2005), s. 625-628. ISSN 0304-8853. E-ISSN 1873-4766.
[Joint European Magnetic Symposium (JEMS´04). Dresden, 05.09.2004-10.09.2004]
R&D Projects: GA MŠMT(CZ) ME 507; GA MŠMT(CZ) ME 508; GA ČR(CZ) GA202/03/0776
Institutional research plan: CEZ:AV0Z10100520
Keywords : amorphous ribbons * depth profile * magneto-optic Kerr effect * giant magnetoimpedance * magnetic sensors
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.985, year: 2005
Permanent Link: http://hdl.handle.net/11104/0131702