Search results
- 1.0446713 - ÚGN 2016 RIV NL eng J - Journal Article
Oleszko, K. - Mlynarczuk, M. - Sitek, Libor - Staš, Lubomír
Application of image processing and different types of imaging devices for three-dimensional imaging of coal grains.
Engineering Geology. Roč. 196, September 2015 (2015), s. 286-292. ISSN 0013-7952. E-ISSN 1872-6917
R&D Projects: GA MŠMT ED2.1.00/03.0082
Institutional support: RVO:68145535
Keywords : 3D imaging * computed tomography * grain size * confocal microscope * optical profilometery
Subject RIV: JQ - Machines ; Tools
Impact factor: 2.196, year: 2015
http://www.sciencedirect.com/science/article/pii/S001379521530020X#
Permanent Link: http://hdl.handle.net/11104/0248698File Download Size Commentary Version Access UGN_0446713.pdf 14 1.1 MB Publisher’s postprint open-access - 2.0424250 - FZÚ 2014 RIV US eng C - Conference Paper (international conference)
Chmelíčková, Hana - Šebestová, Hana - Havelková, Martina - Řiháková, Lenka - Nožka, Libor
Laser welding control by monitoring of plasma.
Optical Measurement Systems for Industrial Inspection VIII. Bellingham: SPIE, 2013 - (Lehmann, P.; Osten, W.; Albertazzi, A.), "87882P-1"-"87882P-8". Proceedings of SPIE, 8788. ISBN 978-0-8194-9604-1. ISSN 0277-786X.
[Optical Measurement Systems for Industrial Inspection /8./. Munich (DE), 13.05.2013-16.05.2013]
R&D Projects: GA TA ČR TA01010517
Institutional support: RVO:68378271
Keywords : laser welding * on-line monitoring * defect detection * parameters control * temperature distribution * confocal microscope
Subject RIV: JB - Sensors, Measurment, Regulation
Permanent Link: http://hdl.handle.net/11104/0230283 - 3.0399552 - FZÚ 2014 RIV US eng C - Conference Paper (international conference)
Palatka, Miroslav - Šebestová, Hana - Hiklová, Helena - Nožka, Libor - Pech, M. - Mandát, D. - Hrabovský, M. - Schovánek, P.
Surface microstructure of water Cherenkov detectors reflective liner – Tyvek.
Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics /18./. Bellingham: SPIE, 2012 - (Peřina jr., J.; Nožka, L.; Hrabovský, M.; Senderáková, D.; Urbańczyk, W.). Proceedings of SPIE, 8697. ISBN 978-0-8194-9481-8. ISSN 0277-786X.
[Czech-Polish-Slovak optical conference on wave and quantum aspects of contemporary optics /18./. Ostravice (CZ), 03.09.2012-07.09.2012]
R&D Projects: GA TA ČR TA01010517
Institutional research plan: CEZ:AV0Z10100522
Keywords : water Cherenkov detector * diffuse reflectivity * confocal microscope * surface profilometry * light scattering
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0226838 - 4.0361137 - ÚTAM 2012 RIV CZ eng J - Journal Article
Dudíková, M. - Kytýř, Daniel - Doktor, Tomáš - Jiroušek, Ondřej
Monitoring of material surface polishing procedure using confocal microscope.
Chemické listy. Roč. 105, č. 17 (2011), s. 790-791. ISSN 0009-2770. E-ISSN 1213-7103
R&D Projects: GA ČR(CZ) GAP105/10/2305
Institutional research plan: CEZ:AV0Z20710524
Keywords : confocal microscope * roughness reduction * sample preparation * surface roughness criteria
Subject RIV: JJ - Other Materials
Impact factor: 0.529, year: 2011
http://www.chemicke-listy.cz/common/content-issue_17-volume_105-year_2011.html
Permanent Link: http://hdl.handle.net/11104/0198531 - 5.0353053 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Bařinka, R. - Hladík, V. - Flodrová, Eva
Investigation of solar cell structures after laser beam processing.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 225.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/305
Institutional research plan: CEZ:AV0Z20650511
Keywords : crystalline silicon solar cells * laser confocal microscope * environmental scanning electron microscope * structures study * laser MicroJet system * fiber laser
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192401 - 6.0353052 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Krejčí, J. - Sajdlová, Z. - Flodrová, Eva
Study of surfaces of electrochemical sensors using optical and scanning electron microscopy.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 226.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/118
Institutional research plan: CEZ:AV0Z20650511
Keywords : electrochemical sensors * laser confocal microscope * environmental scanning electron microscope * surface study
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192400 - 7.0353051 - ÚPT 2011 CN eng A - Abstract
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy electrons * laser confocal microscope * free-standing ultra thin films * very low energy transmission mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192399 - 8.0350660 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 23-24. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy scanning transmission electron microscopy * ultrathin foils * laser confocal microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350660_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190600 - 9.0338930 - FGÚ 2010 RIV CZ cze L4 - Software
Michálek, Jan - Čapek, Martin - Janáček, Jiří - Kubínová, Lucie
Softwarová implementace kompenzace jasových nehomogenit mikroskopických obrazů v ploše, využívající horní Lipschitzův obal.
[Software Implementation of Compensation of Illumination Inhomogeneities of Microscopic Images, Using the Upper Lipschitz Cover.]
Internal code: PlaneBrightnessAdjusting ; 2009
Technical parameters: Programovací jazyk C++, vývojové prostředí MS Visual Studio 2008
R&D Projects: GA ČR(CZ) GA102/08/0691; GA MŠMT(CZ) LC06063
Institutional research plan: CEZ:AV0Z50110509
Keywords : iIllumination inhomogeneities * confocal microscope * Lipschitz cover
Subject RIV: JC - Computer Hardware ; Software
Permanent Link: http://hdl.handle.net/11104/0182580 - 10.0324199 - FGÚ 2009 RIV CZ cze L4 - Software
Čapek, Martin - Michálek, Jan - Janáček, Jiří - Kubínová, Lucie
Softwarová implementace kompenzace útlumu jasu konfokálních obrazů s hloubkou s použitím řezů grafem a deformačního modelu založeným na Markovských náhodných polích.
[Software Implementation of Compensation of the Light Attenuation with Depth of Images Captured by a Confocal Microscope Using a MRF Deformation Model and Graph Cuts.]
Internal code: AttenGraph 1.0 ; 2008
Technical parameters: Programovací jazyk C++, vývojové prostředí MS Visual Studio 2005
R&D Projects: GA ČR(CZ) GA102/08/0691; GA MŠMT(CZ) LC06063
Institutional research plan: CEZ:AV0Z50110509
Keywords : brightness attenuation * graph cuts * confocal microscope
Subject RIV: IN - Informatics, Computer Science
Permanent Link: http://hdl.handle.net/11104/0171955