Search results

  1. 1.
    0553256 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
    Allaham, Mohammad M. - Buchner, P. - Schreiner, R. - Knápek, A. … Total 6 authors
    Testing the performance of Murphy-Good plots when applied to current-voltage characteristics of Si field electron emission tips.
    International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 140-141. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
    [International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
    R&D Projects: GA MV(CZ) VI20192022147
    Institutional support: RVO:68081731
    Keywords : Silicon field emission tips * Murphy-Good plot * electron collection efficiency * array characterization parameters * Silicon field enhancement factor
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
    https://ieeexplore.ieee.org/document/9600690
    Permanent Link: http://hdl.handle.net/11104/0328237
     
     
  2. 2.
    0509479 - FZÚ 2020 RIV NL eng J - Journal Article
    Dubecký, F. - Zat'ko, B. - Kolesár, V. - Kindl, Dobroslav - Hubík, Pavel - Gombia, E. - Dubecký, M.
    Charge collection efficiency of Pt vs. Mg contacts on semi-insulating GaAs.
    Applied Surface Science. Roč. 467, Feb (2019), s. 1219-1225. ISSN 0169-4332. E-ISSN 1873-5584
    Institutional support: RVO:68378271
    Keywords : semi-insulating GaAs * metal-semiconductor contact * metal-oxide-semiconductor contact * charge collection efficiency
    OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
    Impact factor: 6.182, year: 2019
    Method of publishing: Limited access
    https://doi.org/10.1016/j.apsusc.2018.10.164
    Permanent Link: http://hdl.handle.net/11104/0300223
     
     
  3. 3.
    0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
    Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
    STEM modes in SEM – simulations and experiments.
    13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
    [Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0277129
     
     
  4. 4.
    0367297 - FZÚ 2013 RIV NL eng J - Journal Article
    Affolder, A. - Aleev, A. - Allport, P.P. - Böhm, Jan - Mikeštíková, Marcela - Popule, Jiří - Šícho, Petr - Tomášek, Michal - Vrba, Václav … Total 260 authors
    Silicon detectors for the sLHC.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 658, č. 1 (2011), s. 11-16. ISSN 0168-9002. E-ISSN 1872-9576
    R&D Projects: GA MŠMT LA08032; GA ČR GA202/05/0653; GA MŠMT 1P04LA212
    Institutional research plan: CEZ:AV0Z10100502
    Keywords : silicon particle detectors * radiation damage * irradiation * charge collection efficiency
    Subject RIV: BF - Elementary Particles and High Energy Physics
    Impact factor: 1.207, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0202033
     
     
  5. 5.
    0357594 - ÚIACH 2011 RIV NL eng J - Journal Article
    Motyka, K. - Mikuška, Pavel - Večeřa, Zbyněk
    Application of wet effluent diffusion denuder for measurement of uptake coefficient of gaseous pollutants.
    Talanta. Roč. 84, č. 2 (2011), s. 519-523. ISSN 0039-9140. E-ISSN 1873-3573
    R&D Projects: GA MŽP SP/1A3/148/08; GA MŽP SP/1A3/55/08; GA MŽP SP/1B7/189/07
    Institutional research plan: CEZ:AV0Z40310501
    Keywords : collection efficiency * wet effluent diffusion denuder * uptake coefficient
    Subject RIV: CB - Analytical Chemistry, Separation
    Impact factor: 3.794, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0195835
     
     
  6. 6.
    0353090 - ÚCHP 2011 RIV US eng J - Journal Article
    Štefancová, Lucia - Schwarz, Jaroslav - Mäkelä, T. - Hillamo, R. - Smolík, Jiří
    Comprehensive Characterization of Original 10-stage and 7-stage Modified Berner Type Impactors.
    Aerosol Science and Technology. Roč. 45, č. 1 (2011), s. 88-100. ISSN 0278-6826. E-ISSN 1521-7388
    R&D Projects: GA ČR GA205/09/2055; GA MŠMT OC 106; GA MŠMT ME 941
    Institutional research plan: CEZ:AV0Z40720504
    Keywords : cascade impactor * collection efficiency * losses
    Subject RIV: CF - Physical ; Theoretical Chemistry
    Impact factor: 2.667, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0192431
     
     
  7. 7.
    0315458 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Matsuda, K. - Frank, Luděk
    Low Energy Electron Microscopy in Materials Science.
    [Nízko energiová elektronová mikroskopie v materiálových vědách.]
    Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 85-86. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : collection efficiency * cathode lens mode * material contrast
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165656
     
     
  8. 8.
    0315454 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
    Konvalina, Ivo - Hovorka, Miloš - Dvořáková, Marie - Müllerová, Ilona
    Signal Collection with Secondary Electron Detectors in SEM.
    [Detekce signálu v rastrovacím elektronovém mikroskopu pomocí detektorů sekundárních elektronů.]
    Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 61-64. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    R&D Projects: GA AV ČR KJB200650602
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : secondary electrons * collection efficiency * detectors * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165653
     
     
  9. 9.
    0308571 - ÚPT 2008 RIV CZ eng B - Monography
    Konvalina, Ivo
    Quantification of Detection Efficiency of the Detector of Secondary Electrons in SEM.
    [Kvantifikace detekční účinnosti detektoru sekundárních elektronů v REM.]
    Brno: Brno University of Technology, 2008. 30 s. Vědecké spisy VUT , Edice PhD Thesis, sv. 455. ISBN 978-80-214-3622-0. ISSN 1213-4198
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : collection efficiency * ET detector * detector of secondary electrons * electrostatic field * magnetic field * simulation of trajectories
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0161006
     
     
  10. 10.
    0308565 - ÚPT 2008 RIV CZ cze J - Journal Article
    Konvalina, Ivo - Müllerová, Ilona
    Obrazy ze sekundárních elektronů v rastrovacich elektronových mikroskopech.
    [Micrographs of secondary electrons in the scanning electron microscopes.]
    Jemná mechanika a optika. Roč. 53, č. 2 (2008), s. 57-59. ISSN 0447-6441
    R&D Projects: GA ČR GA102/05/2327
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : ET detector * secondary electrons * collection efficiency * electrostatic and magnetic field
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0161002
     
     

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